Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I/sub DDQ/ Testing in BiCMOS and CMOS Circuits
نویسندگان
چکیده
Quiescent power supply current monitoring (looa) has been shown to be effective for testing CMOS devices. BiCA4OS is emerging as a major technologv for high speed, high performance, digital and mixed signal applications. Stuck-ON faults as well as bridging faults in BiCMOS circuits cause enhanced IDDo. An input pattern classi$ation scheme is presented for detection of stuck-ONhridging faults causing enhanced I*nP This technique can also be used for detecting Im,o relatedfaults in CMOS circuits.
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